Speaker
Description
One of the crucial advantages of the PIXE (Particle Induced X-ray Emission) technique is its non-destructive approach to the sample treatment during the analytical process. Rare and precious environmental samples can be analysed in order to evaluate the concentration of individual elements presented in the specimen. Composition of various samples and material has been investigated using PIXE technique in the CENTA laboratory. Non-destructive analysis of chondrite and iron meteorites and various mineral samples were carried out using NEC Pelletron. 3 MeV protons were incident in a narrow ion beam (1.5 mm diam.), and emitted X-rays were detected using Canberra BEGe detector. Each sample was measured in 30 positions distributed in a mesh spread over the sample surface. GUPIXWIN software package was used for spectra evaluation. Concentrations of several elements (e.g. Fe, Ni, Cu, Sr, Zn…) were determined in analysed samples which were subsequently processed into surface distribution maps of investigated elements. A comparison of results obtained by PIXE, neutron activation analysis and traditional chemistry will be presented
