Speaker
Mr
BIN FENG
(Fudan University)
Primary authors
Mr
BIN FENG
(Fudan University)
Dr
Chao Zhao
(Shanghai Institute of Measurement and Testing Technology)
Co-authors
Dr
Bo Chen
(Fudan University)
Prof.
Weihai Zhuo
(Fudan University)
Mr
Linfeng He
(Shanghai Institute of Measurement and Testing Technology)
Prof.
Fangdong Tang
(Shanghai Institute of Measurement and Testing Technology)
